کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10638098 995352 2011 12 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
XAS characterization of the RuO2-Ta2O5 system local (crystal) structure
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
XAS characterization of the RuO2-Ta2O5 system local (crystal) structure
چکیده انگلیسی
The influence of the preparation method on the structural properties of the RuO2-Ta2O5 system was investigated. Both thin films on Ti substrates and powder samples of nominal composition Ti/RuO2-Ta2O5 (Ru:Ta = 100:0, 90:10, 80:20, 30:70, and 0:100 at.%) were prepared through thermal decomposition of polymeric precursors (DPP). The thin films and powder samples were investigated using X-ray absorption spectroscopy (XAS). XANES analyses showed that Ru and Ta are present in the Ru(IV) and Ta(V) oxidation states. EXAFS signals of all the samples were analyzed, to obtain the average bond length (r), coordination number, and the Debye-Waller factor (σ2) for each Ru-O, Ru-Ru, Ta-O nearest-neighbor. The first shell Ru-O distance was found at 1.91-1.92 Å with coordination number of 1.8-2.1, and at 2.01-2.02 Å with coordination number of 3.9-4.1. The Ta-O distance obtained for all the samples and in both modes (transmission and fluorescence) had significantly different values from the theoretical ones. The results revealed that the local structure around both the Ru and Ta sites are similar, and that they consist of distorted M-O6 octahedra (where M = Ru or Ta).
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Chemistry and Physics - Volume 125, Issue 3, 15 February 2011, Pages 449-460
نویسندگان
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