کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10639938 995857 2005 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Electroreflectance and photocurrent measurement of ZnSe/Alq3/TPD heterostructure on Si-substrate
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
Electroreflectance and photocurrent measurement of ZnSe/Alq3/TPD heterostructure on Si-substrate
چکیده انگلیسی
The optical transition energy in ZnSe/tris(8-hydroxyquinoline) aluminum (Alq3)/N,N′-bis(3-methylphenyl)-N,N′-diphenyl-benzidine (TPD) heterostructure were investigated by room-temperature electroreflectance (ER) and photocurrent (PC) measurements. PC signal showed wavelength response of the device in the range of 450-1100 nm. ER features due to optical transition energy of the single quantum well of this structure were observed. The transition energies were determined by fitting the ER spectra to the theoretical line-shape expression. The subband transition energy decreased with increasing well thickness. Under applied voltage, both ER signals show significant shift due to the quantum confined Stark effect.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science and Engineering: B - Volume 123, Issue 2, 20 November 2005, Pages 163-166
نویسندگان
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