کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10653314 | 1002866 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Formation mechanism of ferromagnetism in Si1âxMnx diluted magnetic semiconductors
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Si1âxMnx diluted magnetic semiconductor (DMS) bulks were formed by using an implantation and annealing method. Energy dispersive X-ray fluorescence, transmission electron microscopy (TEM), and double-crystal rocking X-ray diffraction (DCRXD) measurements showed that the grown materials were Si1âxMnx crystalline bulks. Hall effect measurements showed that annealed Si1âxMnx bulks were p-type semiconductors. The magnetization curve as a function of the magnetic field clearly showed that the ferromagnetism in the annealed Si1âxMnx bulks originated from the interaction between interstitial and substitutional Mn+ ions, which was confirmed by the DCRXD measurements. The magnetization curve as a function of the temperature showed that the ferromagnetic transition temperature was approximately 75Â K. The present results can help to improve understanding of the formation mechanism of ferromagnetism in Si1âxMnx DMS bulks.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Solid State Communications - Volume 136, Issue 5, November 2005, Pages 257-261
Journal: Solid State Communications - Volume 136, Issue 5, November 2005, Pages 257-261
نویسندگان
Y.H. Kwon, T.W. Kang, H.Y. Cho, T.W. Kim,