Secondary electron emission yield calculation performed using two different Monte Carlo strategies

The secondary electron emission yield in Al2O3 and polymethylmethacrylate (PMMA) is calculated using two different Monte Carlo approaches, one based on the energy straggling strategy (ES), the other one on the continuous-slowing-down (CSD) approximation. This work is aimed at comparing the secondary electron emission yields calculated by these two Monte Carlo strategies with the available experimental data. The results of both methods are in good agreement with experimental data. The CSD strategy is about 10 times faster than the ES strategy.