کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10674967 1010581 2005 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Single and double electron detachment cross sections for C− incident on helium
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Single and double electron detachment cross sections for C− incident on helium
چکیده انگلیسی
With growth rate method, double electron detachment (DED) cross-sections for 4-15 keV H−+He are reported in this paper and are in agreement with other available experiment results. And for the first time, Single Electron Detachment (SED) cross-sections for 5-30 keV C−+He, Double Electron Detachment (DED) cross-sections for 5-15 keV C−+He are obtained in this work. The SED cross-sections at first increase as the incident ions energy increases, and then decrease as the energy is further increased in 5-30 keV. The DED cross-sections increase as the incident energy increases in the region 5-15 keV.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 229, Issue 1, February 2005, Pages 46-50
نویسندگان
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