کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10675786 1010730 2005 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Depth profiling of nitrogen using 429 keV and 897 keV resonances in the 15N(p, αγ)12C reaction
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Depth profiling of nitrogen using 429 keV and 897 keV resonances in the 15N(p, αγ)12C reaction
چکیده انگلیسی
Resonances at 429 keV and 897 keV in the 15N(p, αγ)12C reaction were investigated for depth profiling nitrogen in materials containing nitrogen isotopes in natural abundances. Both resonances exhibit identical sensitivity, however the resonance at 897 keV is prone to interferences from light elements, F and Al in particular. These resonances were employed to depth profile nitrogen in binary and ternary nitride films and in stainless steel wires that had fractured while in use in an ammonia converter vessel of a heavy water plant. The studies indicated the ingress of nitrogen into the interiors of the wires under operating conditions of the plant that lead to nitriding causing embrittlement of the components.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 240, Issue 3, November 2005, Pages 704-710
نویسندگان
, , , , , ,