کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10675792 | 1010730 | 2005 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Non-destructive quantitative analysis of the Ge concentration in SiGe quantum wells by means of low energy RBS
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
The Ge concentration in MBE-grown SiGe quantum wells was quantitatively and non-destructively analyzed by means of low energy Rutherford backscattering (RBS). The Si1-x1Gex1 quantum wells were clad between Si1-x2Gex2 potential barriers, where x2 > x1. The thicknesses of the analyzed quantum wells were about 12 nm and they were situated at a depth of about 60 nm below the surface. Due to the lower Ge concentration in the quantum well a dip showed up in the RBS spectra, which was evaluated. In order to obtain quantitative results, a sufficiently good depth resolution is required, which was obtained by choosing a primary energy of 500 keV and a tilt angle between 45° and 51° with respect to the surface normal. From the raw data quantitative information was deduced by comparison with simulated spectra. To obtain a spectrum, a fluence of only 1 Ã 1013 projectiles/cm2 was needed, which makes the analysis virtually non-destructive. The Ge concentration in the quantum well could be determined with a precision of 1% absolute.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 240, Issue 3, November 2005, Pages 733-740
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 240, Issue 3, November 2005, Pages 733-740
نویسندگان
M. Draxler, M. Mühlberger, F. Schäffler, P. Bauer,