کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10716146 1027535 2005 37 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Maximal information analysis: I-various Wayne State plots and the most common likelihood principle
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم ابزار دقیق
پیش نمایش صفحه اول مقاله
Maximal information analysis: I-various Wayne State plots and the most common likelihood principle
چکیده انگلیسی
Statistical analysis using all moments of the likelihood L(y|α) (y being the data and α being the fit parameters) is presented. The relevant plots for various data fitting situations are presented. The goodness of fit (GOF) parameter (currently the χ2) is redefined as the isoprobability level in a multidimensional space. Many useful properties of statistical analysis are summarized in a new statistical principle which states that the most common likelihood, and not the tallest, is the best possible likelihood, when comparing experiments or hypotheses.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 552, Issue 3, 1 November 2005, Pages 522-558
نویسندگان
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