کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10716541 | 1027565 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Application of the Si-strip detector in X-ray crystallographic texture measurements
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موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
ابزار دقیق
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Application of the Si-strip detector in X-ray crystallographic texture measurements Application of the Si-strip detector in X-ray crystallographic texture measurements](/preview/png/10716541.png)
چکیده انگلیسی
The traditional data acquisition method of a pole figure by means of the X-ray diffraction technique is based on the usage of a single-slit detector (point counter) at the fixed 2θ position. However, the examination of the crystallographic texture of multi-phase and low-symmetry materials requires acquiring of wider diffraction spectra, when compared to e.g. one-phase metals. This can be achieved by scanning a selected range of the 2θ angle with the single-slit detector (pseudo-PSD mode) or by applying the position-sensitive (linear) detector, or an area detector. The work presents the application of the linear Si-strip detector in the X'Pert system equipped with texture attachment. Full integration of the new detector with existing hardware created new measurement possibilities and reduced the measurement time. Various examples of measured peak profiles and pole figures are presented.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 551, Issue 1, 1 October 2005, Pages 178-182
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 551, Issue 1, 1 October 2005, Pages 178-182
نویسندگان
L. Tarkowski, J. Bonarski, W. Dabrowski,