کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10716815 | 1027575 | 2005 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Ultra-short period X-ray mirrors: Production and investigation
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
ابزار دقیق
پیش نمایش صفحه اول مقاله
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چکیده انگلیسی
Technological problems that deal with manufacturing of highly effective ultra-short (d=0.7-3.2Â nm) period X-ray multilayer mirrors (MLM) are discussed in the article. In an example of Cr/Sc and W/B4C MLM it is experimentally shown, that the problem of periodicity and selectivity for multilayer dispersive X-ray elements has been generally solved by now. However, the problem of short-period MLM reflectivity increase related to existing of transitive borders between layers in structures remains rather urgent. The new technique of tungsten deposition using the RF source in order to decrease roughness in borders is discussed and tested. The results of measurements on wavelengths of 0.154, 0.834 and 1.759Â nm are given. The RbAP crystals ordinary used in experiments and short-period W/B4C MLM produced are compared. The specular and non-specular characteristics of scattering on the 0.154Â nm wavelengths are also measured in order to study transitive borders structures.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 543, Issue 1, 1 May 2005, Pages 333-339
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 543, Issue 1, 1 May 2005, Pages 333-339
نویسندگان
M.S. Bibishkin, N.I. Chkhalo, A.A. Fraerman, A.E. Pestov, K.A. Prokhorov, N.N. Salashchenko, Yu.A. Vainer,