Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress

Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volumes 88–90, September 2018, Pages 164-168

X. Feng, N. Raghavan, S. Mei, S. Dong, K.L. Pey, H. Wong,