کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
11016496 | 1776588 | 2019 | 11 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
A unified MMC reliability evaluation based on physics-of-failure and SM lifetime correlation
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
هوش مصنوعی
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
The reliability of a modular multilevel converter (MMC) is determined both by the component lifetime distribution and the MMC structure. In this paper, a unified submodule (SM) component lifetime is estimated based on the physics- of- failure, and the overall reliability of the MMC system is evaluated considering the SM lifetime correlation. First, the component lifetime estimation is performed in three sub-steps. (a) The current stress of each component, i.e., the insulated gate bipolar transistor modules (IGBTs) and capacitors, is computed according to the working principle of the MMC. (b) The core temperatures of the components are calculated using thermal equivalent networks. For the IGBTs, the thermal cycles are extracted to compute the cumulative damage. (c) The lifetime of each device is estimated in a static state using the lifetime model and damage model. Second, the lifetime Weibull distribution of each component is obtained using the Monte Carlo method. This distribution links the component lifetime estimation and MMC reliability analysis. Finally, considering the SM lifetime correlation, the overall reliability of an MMC system with redundancy is evaluated using a Copula function. The reasons for the impact of SM lifetime correlation on MMC reliability are revealed in a case study.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: International Journal of Electrical Power & Energy Systems - Volume 106, March 2019, Pages 158-168
Journal: International Journal of Electrical Power & Energy Systems - Volume 106, March 2019, Pages 158-168
نویسندگان
Jiayou Xu, Longjun Wang, Yan Li, Zheng Zhang, Gang Wang, Chao Hong,