کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
11016533 | 1777112 | 2018 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
An analytical circuit based nonlinear thermal model for capacitor banks
ترجمه فارسی عنوان
یک مدار تحلیلی مبتنی بر مدل حرارتی غیرخطی برای بانک های خازنی
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
خازن قابلیت اطمینان، مدل حرارتی، طول عمر،
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
چکیده انگلیسی
The thermal couplings among capacitors in a bank could significantly alter the reliability performance compared to a single capacitor. The impact of thermal coupling is becoming stronger for high power density systems due to more stringent constraint in volume. Prior-art studies take into account the thermal coupling effects of a capacitor bank by either Finite Element Method (FEM) or experimental characterization, which are case dependent and time-consuming. This paper proposes a nonlinear mathematical model for capacitor banks based on physics of thermal conduction, convection, and radiation. A simplified version of the model is also obtained and represented by an RC circuit network, which enables computational-efficient thermal stress modeling. The proposed models are convenient to use to support model based sizing of capacitor banks and is scalable for multi-cell rectangle layout. A case study with experimental testing is discussed to verify the accuracy of the models.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volumes 88â90, September 2018, Pages 524-527
Journal: Microelectronics Reliability - Volumes 88â90, September 2018, Pages 524-527
نویسندگان
Haoran Wang, Huai Wang,