کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
11026990 | 1666335 | 2019 | 10 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Dispersion properties in the visible range of carrier concentration of topologically protected Bi1-xSex films revealed by spectroscopic ellipsometry
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Dispersion properties in the visible range of carrier concentration of topologically protected Bi1-xSex films revealed by spectroscopic ellipsometry Dispersion properties in the visible range of carrier concentration of topologically protected Bi1-xSex films revealed by spectroscopic ellipsometry](/preview/png/11026990.png)
چکیده انگلیسی
Optical properties evolution of Bi1-xSex films with different compositions were investigated by spectroscopic ellipsometry (SE). A significant dispersion of penetration depth of Bi0.38Se0.62 films was observed, which would lead to a varying carrier concentration with the different wavelength because of the topologically protected surface state. To describe the special properties of topological insulators, dispersive plasma energy was introduced into traditional dielectric function model. Optical properties of Bi0.38Se0.62 film were acquired by this modified model and the topologically protected surface state could be represented from the dispersion properties of free carrier concentration with the smaller plasma energy versus the deeper penetration depth. We demonstrated that SE is a useful tool for characterizing the properties of the topological insulators.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 465, 28 January 2019, Pages 532-536
Journal: Applied Surface Science - Volume 465, 28 January 2019, Pages 532-536
نویسندگان
Jin-Bo Zhang, Dong-Xu Zhang, Yu-Xiang Zheng, Rong-Jun Zhang, Zi-Yi Wang, Shang-Dong Yang, Liao Yang, Dong-Dong Zhao, Song-You Wang, Liang-Yao Chen,