کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1195062 | 1492389 | 2006 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
High resolution studies of low-energy electron attachment to SF5Cl: Product anions and absolute cross sections
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی آنالیزی یا شیمی تجزیه
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چکیده انگلیسی
Low-energy electron attachment to SF5Cl was studied at high energy resolution by mass spectrometric detection of the product anions. Two variants of the laser photoelectron attachment (LPA) technique (Kaiserslautern) were used for determining the threshold behaviour of the yield for SF5â formation at about 1Â meV resolution, and to investigate the relative cross sections for Clâ, FClâ, and SF5â formation towards higher energies (up to 1Â eV) at about 20Â meV resolution. Thermal swarm measurements (Birmingham) were used to place the relative LPA cross sections on an absolute scale. A trochoidal electron monochromator (Innsbruck) was used for survey measurements of the relative cross sections for the different product anions over the energy range of 0-14Â eV with a resolution of 0.30Â eV. Combined with earlier beam data (taken at Berlin) [M. Fenzlaff, R. Gerhard, E. Illenberger, J. Chem. Phys. 88 (1988) 149], the present experimental results provide a detailed set of partial cross sections for anion formation in low-energy electron collisions with SF5Cl.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: International Journal of Mass Spectrometry - Volume 252, Issue 3, 1 June 2006, Pages 234-241
Journal: International Journal of Mass Spectrometry - Volume 252, Issue 3, 1 June 2006, Pages 234-241
نویسندگان
M. Braun, M.-W. Ruf, H. Hotop, P. Cicman, P. Scheier, T.D. Märk, E. Illenberger, R.P. Tuckett, C.A. Mayhew,