کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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1265587 | 972231 | 2008 | 4 صفحه PDF | دانلود رایگان |

The degradation mechanism of a polymer light-emitting device (PLED) based on poly(3,4-ethylenedioxythiophene) poly(4-styrenesulfonate) (PEDOT:PSS) was investigated by X-ray scanning photoelectron microscopy. Spectromicroscopic analysis of the surface of the emission layer (EML) of the degraded PLED revealed that island-like structures, containing sulfur (S) presumably in sulfide (–C–S–C–) and thiol (–C–S–H) configurations, were generated. The analysis results further suggest that S out-diffused from the PEDOT:PSS layer and formed sulfide and thiol configurations in the EML, and that effective conduction path channels were generated through the island-like structures for current dissipation between the electrodes, resulting in PLED degradation.
Journal: Organic Electronics - Volume 9, Issue 5, October 2008, Pages 869–872