Printing-induced improvements of organic thin-film transistors

To understand the observation of improved pentacene (Pn) thin-film transistor mobility in flexible printed devices, a method for performing electrical measurements of organic thin-film transistors (OTFT) during the process of transfer printing has been developed. Different sample configurations were designed to test two aspects of the printing process: (1) the formation of the source/drain contacts a Pn thin-film, and (2) the formation of the transfer printed Pn/dielectric interface. In situ measurements show that pressure-induced contacts of gold (Au) electrodes result in a factor of seven mobility improvement compared with evaporation of top Au electrodes on an otherwise identical device configuration. Annealing the laminated device up to 90 °C caused no further improvement, and heating above 90 °C degraded performance. The mobility of a transfer printed device with the rough, as-grown top surface of the Pn in contact with the dielectric was found to increase dramatically with subsequent annealing for a sample temperature up to 120 °C. This is attributed to annealing-induced structural changes in the Pn film at elevated temperatures, consistent with X-ray bulk measurements showing enhanced crystal morphology in transfer printed Pn thin-films.