The study of BiCrxFe1−xO3 thin films synthesized by sol–gel technique

Cr-doped bismuth ferrite (BiCrxFe1−xO3, BCFO) thin films were prepared by a sol–gel method with the value of x varying from 0 mol% to 10 mol%. The structures of the BCFO thin films were characterized by X-ray diffraction (XRD) and scanning electron microscopy (SEM) analysis was employed to represent the surface and cross-sectional morphologies of the thin films. Dielectric, electrical, ferroelectric and magnetic properties were measured by HP4294A, Keithley 4200, RT6000 and 6700 Magnet Controller at room temperature, respectively. The dielectric behaviour and insulation are improved in 3% Cr-doped BFO thin film which may be due to the reduced concentration of oxygen vacancies by 3% Cr doping.