Effects of Ta5+ doping on microstructure evolution, dielectric properties and electrical response in CaCu3Ti4O12 ceramics

The effects of Ta5+ substitution on the microstructure, electrical response of grain boundary, and dielectric properties of CaCu3Ti4O12 ceramics were investigated. The mean grain size decreased with increasing Ta5+ concentration, which was ascribed to the ability of Ta5+ doping to inhibit grain boundary mobility. This can decrease dielectric constant values. Grain boundary resistance and potential barrier height of CaCu3Ti4O12 ceramics were reduced by doping with Ta5+. This results in enhancement of dc conductivity and the related loss tangent. Influence of charge compensations on microstructure and intrinsic electrical properties of grain boundaries resulting from the effects of replacing Ti4+ with Ta5+ are discussed. The experimental data and variation caused by the substitution of Ta5+ can be described well by the internal barrier layer capacitor model based on space charge polarization at the grain boundaries.