کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1476706 | 1510147 | 2007 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg1/3Ta2/3)O3
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg1/3Ta2/3)O3 Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg1/3Ta2/3)O3](/preview/png/1476706.png)
چکیده انگلیسی
Raman, X-ray diffraction and extended X-ray absorption fine structure (EXAFS) measurements of xBa(Ni1/3Ta2/3)O3 + (1 â x)Ba(Mg1/3Ta2/3)O3 samples with x = 0-0.03 were performed to reveal the nickel doping effect on the microwave properties. EXAFS result clearly shows that the nickel is located on the Mg lattice site. We also found that, as the nickel concentration increases, microwave dielectric constant decreases with the TaO and NiO bond distances. X-ray diffraction shows that the 1:2 ordered structure is degraded with the increasing of nickel concentration. The stretching phonon of the TaO6 octahedra, that is A1g(O) phonon near 800 cmâ1, are strongly correlated to the microwave properties of xBa(Ni1/3Mg2/3)O3 + (1 â x)Ba(Mg1/3Ta2/3)O3 samples. The large Raman shift and the large width of the A1g(O) imply rigid but distorted oxygen octahedral structure, therefore, the effect of nickel doping lowers the dielectric constant and the Q Ã f value of Ba(Mg1/3Ta2/3)O3 ceramic.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of the European Ceramic Society - Volume 27, Issues 8â9, 2007, Pages 2995-2999
Journal: Journal of the European Ceramic Society - Volume 27, Issues 8â9, 2007, Pages 2995-2999
نویسندگان
Mei Yu Chen, P.J. Chang, C.T. Chia, Y.C. Lee, I.N. Lin, L.-J. Lin, J.F. Lee, H.Y. Lee, T. Shimada,