کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1479813 | 1510169 | 2016 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
TEM and SEM study of nano SiO2 particles exposed to influence of neutron flux
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سرامیک و کامپوزیت
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چکیده انگلیسی
Before and after neutron irradiation, in order to identify the “adhesion” in silica nanoparticles, analyses have been conducted on transmission electron microscope (TEM) at small nano dimensions. Simultaneously, at relatively larger nano dimensions, the surfaces of the samples were observed by the scanning electron microscope (SEM). Moreover, analyses of the samples with SAED (selected area electron diffraction) technology on TEM device used for determining the structure of the nanomaterial. From TEM analyses, it has been found that little “adhesion” is observed at small dimensions (maximum 70 nm) under the influence of neutron irradiation and this “adhesion” directly influences the electrophysical properties of nanomaterials.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Materials Research and Technology - Volume 5, Issue 3, July–September 2016, Pages 213–218
Journal: Journal of Materials Research and Technology - Volume 5, Issue 3, July–September 2016, Pages 213–218
نویسندگان
Elchin Huseynov, Adil Garibov, Ravan Mehdiyeva,