کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1481086 1510450 2014 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Low temperature magnetron sputtering deposition of hydrogenated microcrystalline silicon thin films without amorphous incubation layers on glass
ترجمه فارسی عنوان
رسوب پراکنده مگنترون در دمای پایین از فیلمهای نازک سیلیکون میکرو کریستالین هیدروژنه بدون لایه های انکوباتور آمورف بر روی شیشه
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
چکیده انگلیسی


• The μc-Si:H thin films were deposited by low temperature magnetron sputtering.
• The μc-Si:H thin films without the amorphous incubation layer was obtained.
• The possible growth mechanism of μc-Si:H thin films was discussed.

Hydrogenated microcrystalline silicon (μc-Si:H) thin films were deposited on glass by magnetron sputtering at the substrate temperature of 100 °C and the hydrogen dilution ratio of 65%. The crystallinity and microstructure of thin films were systematically studied using Raman spectroscopy, X-ray diffraction (XRD), transmission electron microscopy (TEM), and Fourier transform infrared spectroscopy (FT-IR). The results showed that the μc-Si:H thin film was amorphous and hydrogen-rich at the initial stage of the growth. This amorphous layer was crystallized during further growth. The crystallinity of thin films is not almost changed with the increase of thickness when the thickness of thin film exceeds 70 nm. Finally, the μc-Si:H thin film without amorphous incubation layer was obtained. The possible growth mechanism of fabricating μc-Si:H thin films without amorphous incubation layers was also discussed.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Non-Crystalline Solids - Volume 388, 15 March 2014, Pages 86–90
نویسندگان
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