کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1481331 1510471 2013 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Imaging ellipsometry mapping of photo-induced refractive index in As2S3 films
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Imaging ellipsometry mapping of photo-induced refractive index in As2S3 films
چکیده انگلیسی

Photoinduced diffraction grating formation in amorphous As2S3 thin films has been studied using imaging ellipsometry. We first have applied the ACCURION Nanofilm-EP3SE Imaging Spectroscopic Ellipsometer to obtain mapping of diffraction gratings in amorphous As2S3 thin films based on different photoinduced phenomena, namely photodarkening and photoinduced changes of refractive index.The profile and absolute value of refractive index in gratings were studied as a function of exposure. It is shown that underexposure led to the formation of a sinusoidal profile of the refractive index. The proper exposure produced results close to the cycloidal profile. Overexposure led to the same cycloidal profile but with reduced amplitude of refractive index variation in comparison with that obtained under proper exposure.


► Phase diffraction gratings formation has been studied.
► The profile of phase grating has been studied in dependence of exposure.
► Absolute value of refractive index has been studied in dependence of exposure.
► Imaging ellipsometry has been used.
► Sinusoidal and cycloidal profiles of the phase gratings have been obtained.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Non-Crystalline Solids - Volume 365, 1 April 2013, Pages 93–98
نویسندگان
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