کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1481491 991530 2012 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Network and void structures for glasses with a higher resistance to crack formation
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Network and void structures for glasses with a higher resistance to crack formation
چکیده انگلیسی

To clarify the nanoscale deformation and fracture behaviors of glass under stress, changes in the network and void structures of xNa2O–(1 − x)SiO2 glasses are investigated at a constant strain rate via molecular dynamics (MD) simulation and volume rendering methods. Glasses with higher Na2O contents have lower polymerized network structures and lower Young's moduli, but exhibit smaller total void volumes and void sizes. Under tension, network breakdown increases the total void volume and void size of SiO2 glass. Hence, SiO2 glass breaks at a relatively small strain due to decreased flow. In contrast, network rearrangement slightly increases the void volume and void size of Na2O-containing glass. Consequently, Na2O-containing glass breaks at a larger strain due to increased flow. Under compression, SiO2 glass shows a larger densification than Na2O-containing glasses, because densification is attributed to crushing larger voids into smaller voids. These results indicate that controlling the structure is crucial to suppress crack formation because the network and void structures strongly affect deformation and fracture.


► Clarification of glass structure with higher resistance to crack formation.
► Crack formation depends on flow and densification which cause stress relaxation.
► Glass with lower polymerized network structure shows easy flow.
► Glass with larger void volume and size shows easy densification.
► The control of void and network structures enables to suppress crack formation of glass.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Non-Crystalline Solids - Volume 358, Issue 24, 15 December 2012, Pages 3453–3458
نویسندگان
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