کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1481688 | 991538 | 2012 | 4 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: Enhanced luminescence from Si quantum dots/SiO2 multilayers by hydrogen annealing Enhanced luminescence from Si quantum dots/SiO2 multilayers by hydrogen annealing](/preview/png/1481688.png)
Si quantum dots/SiO2 multilayers were prepared by annealing a-Si:H/SiO2 stacked structures at 1100 °C . Photo- and electro-luminescence band around 750 nm can be observed from Si QDs/SiO2 multilayers due to the recombination of electron-hole pairs in Si QDs/SiO2 interfaces. The electro-luminescence intensity was obviously enhanced after post hydrogen annealing at 400 °C. Electron spin resonance measurements were used to characterize the change of the defect states after hydrogen annealing. It is found that there exists a-centers (g value = 2.006), which is related to the Si dangling bonds in Si QDs in our samples. Hydrogen annealing can significantly reduce non-luminescent a-centers and enhance the electro-luminescence intensity consequently.
► Si QDs/SiO2 multilayers were prepared by annealing a-Si:H/SiO2 stacked structures.
► Room temperature electroluminescence can be observed from Si QDs-based multilayers.
► EL intensity is significantly enhanced by hydrogen annealing at 400 °C.
► ESR demonstrated that hydrogen annealing can passivate defect states in Si QDs.
Journal: Journal of Non-Crystalline Solids - Volume 358, Issue 17, 1 September 2012, Pages 2141–2144