کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1485437 1510543 2007 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
X-ray photoelectron spectroscopy of erbium-activated-silica–hafnia waveguides
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
X-ray photoelectron spectroscopy of erbium-activated-silica–hafnia waveguides
چکیده انگلیسی

X-ray photoelectron spectroscopy (XPS) has been used in the study of sol gel-derived Er3+-activated xHfO2–(100 − x)SiO2 (x = 10, 20, 30, 40, 50 mol) planar waveguides. The analysis of Si 2p and O 1s core lines were related to the Hf/Si molar ratio to assess the role of hafnia in modifying the silica network. Increasing the HfO2 content brings about a change of the Si 2p and O 1s binding energy respect to those from pure silica. This trend is explained with a formation of hafnium silicate in the matrix with successive phase separation between HfO2 and SiO2 rich phases. XPS results show that hafnia is well dispersed in the silica matrix for molar concentration below 30%. Formation of pure HfO2 domains was detected at higher hafnia concentrations in agreement with previous spectroscopic analyses.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Non-Crystalline Solids - Volume 353, Issues 5–7, 1 April 2007, Pages 502–505
نویسندگان
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