The influence of the polymer matrix on the dielectric and electrical properties of conductive polymer composites based on polyaniline

The dielectric properties of conducting polymer composite films based on polyaniline located in a thin layer in the vicinity of the surface of different insulating polymer matrices (polyamide and poly(ethylene terephthalate)) have been studied using dielectric relaxation spectroscopy in a wide temperature and frequency range. Several relaxation processes related to the film surface conductivity and influenced by the nature of the polymer matrix have been found in these composites. The nature of the polymer matrix is found to influence the rate of aniline polymerization, the distribution of polyaniline clusters and the depth of aniline penetration as shown, respectively, by Conducting Probe AFM and Raman spectroscopy. These features are correlated to the dielectric behavior of the composite films.