کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1496494 992966 2009 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Extended transfer matrix modeling of an erbium-doped cavity with SiO2/TiO2 Bragg reflectors
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Extended transfer matrix modeling of an erbium-doped cavity with SiO2/TiO2 Bragg reflectors
چکیده انگلیسی

Starting from the measured parameters of multilayer microcavities activated by Er3+ ion, we developed a comprehensive model based on extended (3 × 3) transfer matrix formalism including sources. The cavity, fabricated by rf-sputtering technique, was constituted by an Er3+-activated SiO2 active layer inserted between two six-pair SiO2/TiO2 distributed Bragg reflectors. Near infrared transmittance spectra evidence the presence of a stop-band from 1350 to 1850 nm and a cavity resonance centered at 1537 nm. Intensity enhancement and narrowing of the 4I13/2→4I15/24I13/2→4I15/2 emission band of Er3+ ion were observed, owing to the cavity effect. A cavity quality factor of 171 was achieved. All observations show excellent agreement with transfer matrix simulations, leading to improvements of the devices design operating in laser regime.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optical Materials - Volume 31, Issue 9, July 2009, Pages 1306–1309
نویسندگان
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