Kinetics of a retracting solid film edge: The case of high surface anisotropy

A model describing the retraction kinetics of a fully faceted edge of a single crystalline thin film deposited on a non-wetting substrate is proposed. The kinetics of retraction is very similar to that of a fully isotropic film. The calculated topography profile of the edge exhibits a single maximum and no local minima (depressions). The implications for the solid-state dewetting mechanisms are discussed.

Research highlights
► We propose a model describing the retraction kinetics of the fully faceted thin film edge.
► Fully faceted edges do not exhibit a depression which characterizes retracting isotropic edges.
► The absence of depression changes the mechanism of solid state dewetting of thin films.
► Our experimental data for thin Au-Fe films confirm the predictions of the model.