کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1499763 993320 2011 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Interfacial and rectifying characteristic of epitaxial SrTiO3-δ/GaAs p–n junctions
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Interfacial and rectifying characteristic of epitaxial SrTiO3-δ/GaAs p–n junctions
چکیده انگلیسی

Oxygen-deficient SrTiO3-δ thin films were grown on p-GaAs substrates to form p–n heterojunctions. The interfacial and transport characteristics of the heterojunctions have been investigated. The sharp interface was found to be epitaxially crystallized. The junctions present good rectifying behaviors and thickness dependence of current–voltage properties. The electronic transport of 200 nm thick SrTiO3-δ/GaAs could be explained by a space charge limited model. When the thickness was reduced further, the diode ideality factors were almost temperature independent, which might be attributed to a strain-assisted tunneling mechanism.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Scripta Materialia - Volume 65, Issue 4, August 2011, Pages 323–326
نویسندگان
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