Transmission electron microscopy characterization of the deformation of CdZnTe single crystals induced by nanoscratching

The deformation characteristics of soft-brittle CdZnTe single crystals induced by nanoscratching were investigated using cross-sectional transmission electron microscopy. Significant pile-up was observed, but no amorphization phases existed. Twins, stacking faults and nanocrystals were found in the scratched subsurface. This is somewhat different from the deformation patterns obtained from our previous nanogrinding study, where twins were seldom observed. The deformation mechanisms were discussed.