کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1500156 993336 2009 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Atomic scale characterization of deformation-induced interfacial mixing in a Cu/V nanocomposite wire
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Atomic scale characterization of deformation-induced interfacial mixing in a Cu/V nanocomposite wire
چکیده انگلیسی

The microstructure of a Cu/V nanocomposite wire processed by cold drawing was investigated by high-resolution transmission electron microscopy and atom probe tomography. The experimental data clearly reveal some deformation-induced interfacial mixing where the vanadium filaments are nanoscaled. The mixed layer is a 2 nm wide vanadium gradient in the face-centered cubic (fcc) Cu phase. This mechanical mixing leads to the local fragmentation and dissolution of the filaments and to the formation of vanadium supersaturated solid solutions in fcc Cu.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Scripta Materialia - Volume 61, Issue 6, September 2009, Pages 660–663
نویسندگان
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