کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1500509 | 993349 | 2011 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Mapping the dislocation sub-structure of deformed polycrystalline Ni by scanning microbeam diffraction topography
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Mapping the dislocation sub-structure of deformed polycrystalline Ni by scanning microbeam diffraction topography Mapping the dislocation sub-structure of deformed polycrystalline Ni by scanning microbeam diffraction topography](/preview/png/1500509.png)
چکیده انگلیسی
When subjected to plastic deformation, grains within ductile face-centred cubic polycrystals fragment into “soft”, low dislocation density cells separated by “hard”, dislocation-rich walls. Using a narrow-bandwidth, sub-micrometre X-ray beam, we have mapped the deformation structure inside a single grain within a deformed Ni polycrystal. Dislocation multiplication and entanglement was found to vary depending on the physical dimensions of the grain. The method we use overcomes current limitations in classical X-ray topography allowing topographic images to be formed from small, highly deformed grains.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Scripta Materialia - Volume 64, Issue 9, May 2011, Pages 884–887
Journal: Scripta Materialia - Volume 64, Issue 9, May 2011, Pages 884–887
نویسندگان
Brian Abbey, Felix Hofmann, Jonathan Belnoue, Alexander Rack, Remi Tucoulou, Gareth Hughes, Sophie Eve, Alexander M. Korsunsky,