Defect generation in nano-twinned, nano-grained and single crystal Cu systems caused by wear: A molecular dynamics study

Dynamic electrical contacts may lose their conductivity due to wear or oscillation-induced defects (primarily dislocations). Nano-twinned Cu appears to be a promising candidate for dynamic contacts. Molecular dynamics simulations have been conducted to study defect generation in nano-twinned Cu during wear, in comparison with nano-grained Cu and single crystal Cu. Defect generation in the former was lower during bidirectional sliding wear. The Bauschinger effect was noticed during bidirectional sliding, demonstrated by a decrease in the density of residual defects.