کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1500962 | 993366 | 2008 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Mechanical deformation of high-purity sputter-deposited nano-twinned copper
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Near classical yield points were reproducibly observed at room and liquid nitrogen temperatures during tensile deformation of 170 μm thick, high-purity copper foils synthesized by magnetron sputter deposition. Uniformly distributed mobile dislocations introduced by rolling to ∼20% reduction in thickness eliminated the yield point at both temperatures. The experimental observations clearly demonstrate that the observed yield-point behavior is a direct result of the very low initial dislocation density in these sputtered films as expected for “ideal” nanoscale microstructural materials.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Scripta Materialia - Volume 59, Issue 2, July 2008, Pages 163–166
Journal: Scripta Materialia - Volume 59, Issue 2, July 2008, Pages 163–166
نویسندگان
A.M. Hodge, Y.M. Wang, T.W. Barbee Jr.,