کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1501287 993377 2008 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Validating grain size analysis from X-ray line broadening: A virtual experiment
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Validating grain size analysis from X-ray line broadening: A virtual experiment
چکیده انگلیسی

We inspect the accuracy of a standard analysis, here a Williamson–Hall variant, for determining the grain size and microstrain of nanocrystalline samples by analysis of X-ray diffraction data. The diffractograms were computer-generated, based on large samples of nanocrystalline Pd obtained by molecular dynamics simulation. The algorithm supplies accurate grain size values. Remarkably, although the grain interiors are free of lattice defects, the microstrain is significant and matches closely that of experiments on samples of similar grain size.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Scripta Materialia - Volume 59, Issue 1, July 2008, Pages 15–18
نویسندگان
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