کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1501761 993394 2007 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Improving the spatial resolution of a magnetic force microscope tip via focused ion beam modification and magnetic film coating
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Improving the spatial resolution of a magnetic force microscope tip via focused ion beam modification and magnetic film coating
چکیده انگلیسی

To fabricate high-resolution magnetic tips by a more convenient method, this study applied focused ion beam milling and magnetic film coating techniques to manufacture high aspect ratio (HAR) magnetic force microscope (MFM) tips. The results showed that a HAR MFM tip with a ratio of 10:1 was successfully fabricated. MFM measurements demonstrated that this probe provided clear high-resolution MFM images. The ultimate lateral resolution of the HAR MFM tip was reduced to a minimum of 20 nm.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Scripta Materialia - Volume 56, Issue 5, March 2007, Pages 365–368
نویسندگان
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