On the nucleation and growth of Zn1−xMnxO thin films grown by RF magnetron sputtering

The critical nucleation parameters, such as radius of the critical nucleus, critical free energy change and number of molecules in the critical nucleus, have been evaluated for the first time for Zn1−xMnxO films on a sapphire substrate. Zn1−xMnxO films grown on sapphire substrates by radiofrequency sputtering have been characterized using X-ray diffraction and vibrating sample magnetometry. The variation of structural and magnetic properties due to Mn concentration has been interpreted by numerically evaluated critical nucleation parameters.