کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1502406 993419 2006 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Application of edge-to-edge matching model to understand the in-plane texture of TiSi2 (C49) thin films on (0 0 1)Si surface
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Application of edge-to-edge matching model to understand the in-plane texture of TiSi2 (C49) thin films on (0 0 1)Si surface
چکیده انگلیسی

The edge-to-edge matching model, which was originally developed for predicting crystallographic features in diffusional phase transformations in solids, has been used to understand the formation of in-plane textures in TiSi2 (C49) thin films on Si single crystal (0 0 1)Si surface. The model predicts all the four previously reported orientation relationships between C49 and Si substrate based on the actual atom matching across the interface and the basic crystallographic data only. The model has strong potential to be used to develop new thin film materials.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Scripta Materialia - Volume 55, Issue 7, October 2006, Pages 613–616
نویسندگان
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