Misfit dislocations in an annular strained film grown on a cylindrical nanopore surface

The critical thickness of a film for the formation of a misfit dislocation in the system of a strained film grown on a nanopore is studied. The influence of the ratio of the shear modulus between the film and the substrate, the misfit strain and the radius of the nanopore on the critical thickness of the film is discussed. New phenomena concerning the critical thickness of the film are obtained due to the difference in elastic constants of the film and the substrate.