Diffusion-induced recrystallization in silver-palladium layers

The interdiffusion of Pd-Ag thin film diffusion couples is investigated by transmission electron microscopy and X-ray diffractometry at a temperature of 723 K. By comparison with calculated diffractograms, it is shown that a diffusion-induced recrystallization takes place, which produces a first generation of new grains with a dominant composition of 24.5 at.% Pd inside the diffusion zone.