کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1503698 993502 2006 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Non-destructive characterization of recrystallization kinetics using three-dimensional X-ray diffraction microscopy
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Non-destructive characterization of recrystallization kinetics using three-dimensional X-ray diffraction microscopy
چکیده انگلیسی

Three-dimensional X-ray diffraction (3DXRD) is used to characterize the nucleation and early growth of individual bulk nuclei in situ during recrystallization of 92% cold-rolled copper. It is found that some cube nuclei, but not all, have a significantly faster initial growth than the average growth kinetics. These results are discussed and compared to previous 3DXRD results for recrystallization of aluminum alloys, and implications of the results on modeling of recrystallization are considered. Finally, a new 3DXRD technique suitable for non-destructive 3D characterization is outlined and its potential for recrystallization studies is discussed.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Scripta Materialia - Volume 55, Issue 1, July 2006, Pages 51–56
نویسندگان
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