کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1505220 993755 2011 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Atom distribution in SnSb2Te4 by resonant X-ray diffraction
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Atom distribution in SnSb2Te4 by resonant X-ray diffraction
چکیده انگلیسی

The atom distribution in SnSb2Te4 (R  3¯m, a = 4.298(1), c = 41.57(1) Å) has been elucidated by resonant single-crystal diffraction using synchrotron radiation with wavelengths near the K absorption edges of the elements present and additional non-resonant data. Refinement of site occupancies for all atoms on all sites was done with a joint refinement using five datasets. It shows that there is almost no anti-site disorder and no significant amount of vacancies. The cations are neither fully ordered nor randomly distributed. The 21R-type structure consists of rocksalt-type blocks separated by van der Waals gaps. Each block consists of four anion and three cation layers. Sn atoms are distributed over all cation sites but cluster in the middle of the blocks.

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ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Solid State Sciences - Volume 13, Issue 5, May 2011, Pages 1157–1161
نویسندگان
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