کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1506701 993805 2008 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Thin film engineering for N@C60 quantum computers: Spin detection and device patterning approaches
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Thin film engineering for N@C60 quantum computers: Spin detection and device patterning approaches
چکیده انگلیسی

Using pulsed electrically detected magnetic resonance (p-EDMR), we measured the coherent spin evolution of about 10,000 paramagnetic states in C60 fullerene thin films, opening a way to study potentially single-qubit read-out mechanisms of N@C60 molecules. The N@C60 compatible, low-temperature method of spray-deposition of fullerenes on silicon substrates pre-patterned by local anodic oxidation is shown to yield fullerene structures on the 10 nm scale, still somewhat too coarse for quantum register structures, but suitable for further steps in the application of the p-EDMR method to N@C60.

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ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Solid State Sciences - Volume 10, Issue 10, October 2008, Pages 1314–1321
نویسندگان
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