کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1515539 | 1511525 | 2015 | 11 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
High-pressure phases of SF6 up to 32Â GPa from X-ray diffraction and Raman spectroscopy
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
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چکیده انگلیسی
X-ray diffraction and Raman spectroscopy were employed to study the phase diagram of SF6 at pressures up to 32Â GPa. The known phase transformation of SF6 phase I to phase II at around 2Â GPa was confirmed. Discontinuities in the pressure dependence of the Raman frequencies and positions of X-ray reflections indicate further phase transitions at 10(1) and 19(1)Â GPa. The crystal structures of phases I and II were determined using single crystal X-ray diffraction. The structure of phase I corresponds to the “plastic” body-centred cubic low-temperature structure and the structure of phase II to the ordered monoclinic low-temperature structure. The bulk moduli of phase I and II were determined to be B0,I=6.3(2)GPa with BIâ²=4 (fixed) and B0,II=8.5(8)GPa with BIIâ²=7.4(9), respectively. The linear compressibilities of phase II showed a slight anisotropy, which can be rationalised by consideration of the packing of the SF6 molecules.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Physics and Chemistry of Solids - Volume 80, May 2015, Pages 11-21
Journal: Journal of Physics and Chemistry of Solids - Volume 80, May 2015, Pages 11-21
نویسندگان
N. Rademacher, A. Friedrich, W. Morgenroth, L. Bayarjargal, V. Milman, B. Winkler,