Electron beam induced current imaging of dislocations in Cd0.9Zn0.1Te crystal

Electron beam induced current (EBIC) imaging of semi-insulating nuclear radiation detector grade cadmium zinc telluride (CZT) crystal is reported in this paper. The correlation of the EBIC results with the results of defect delineating chemical etching suggests that the irregular shaped pattern in the EBIC image is due to agglomerates of dislocations in CZT crystal.

► Electron beam induced current (EBIC) imaging has been carried out on detector grade CZT crystals.
► EBIC results have been correlated with defect delineating chemical etching results.
► Results suggest that the irregular shaped patterns are agglomerates of dislocations.