کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1516995 1511579 2010 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
High pressure X-ray diffraction study of ReS2
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
High pressure X-ray diffraction study of ReS2
چکیده انگلیسی

The high-pressure behavior of rhenium disulfide (ReS2) has been investigated to 51.0 GPa by in situ synchrotron X-ray diffraction in a diamond anvil cell at room temperature. The results demonstrate that the ReS2 triclinic phase is stable up to 11.3 GPa, at which pressure the ReS2 transforms to a new high-pressure phase, which is tentatively identified with a hexagonal lattice in space group P6̄m2. The high-pressure phase is stable up to the highest pressure in this study (51.0 GPa) and not quenchable upon decompression to ambient pressure. The compressibility of the triclinic phase exhibits anisotropy, meaning that it is more compressive along interlayer directions than intralayer directions, which demonstrates the properties of the weak interlayer van der Waals interactions and the strong intralayer covalent bonds. The largest change in the unit cell angles with increasing pressures is the increase of β, which indicates a rotation of the sulfur atoms around the rhenium atoms during the compression. Fitting the experimental data of the triclinic phase to the third-order Birch–Murnaghan EOS yields a bulk modulus of KOT=23±4 GPa with its pressure derivative KOT′= 29±8, and the second-order yields KOT=49±3 GPa.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Physics and Chemistry of Solids - Volume 71, Issue 11, November 2010, Pages 1571–1575
نویسندگان
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