Compression of silver in a diamond anvil cell: Pressure dependences of strength and grain size from X-ray diffraction data

Two silver samples, coarse grained (c-Ag, grain size 300±30 nm) and nanocrystalline (n-Ag, grain size 55±6 nm), are compressed in a diamond anvil cell in separate experiments. The pressure is increased in steps of ∼3 GPa and the diffraction pattern recorded at each pressure. The grain size and compressive strength are determined from the analysis of the diffraction line-widths. The grain size of c-Ag decreases rapidly from 300±30 nm at ambient pressure to 40±8 nm at 15 GPa, and then gradually to 20±3 nm at 40 GPa. After pressure release to ambient condition, the grain size is 25±4 nm. The strength at ambient pressure is 0.18±0.05 GPa and increases to 1.0±0.3 GPa at 40 GPa. The grain size of n-Ag decreases from 55±6 nm at ambient pressure to 17±4 nm at 15 GPa and to 14±3 nm at 55 GPa. After release of pressure to ambient condition, the grain size is 50±7 nm. The strength increases from 0.51±0.07 GPa at ambient pressure to 3.5±0.4 GPa at 55 GPa. The strength is found to vary as the inverse of the square-root of the grain size. The results of the present measurements agree well with the grain-size dependence of strength derived from the hardness versus grain size data at ambient pressure available in the literature.