کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1517438 | 1511604 | 2008 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
In situ high-pressure X-ray diffraction study of densification of a molecular chalcogenide glass
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: In situ high-pressure X-ray diffraction study of densification of a molecular chalcogenide glass In situ high-pressure X-ray diffraction study of densification of a molecular chalcogenide glass](/preview/png/1517438.png)
چکیده انگلیسی
Structural mechanisms of densification of a molecular chalcogenide glass of composition Ge2.5As51.25S46.25 have been studied in situ at pressures ranging from 1Â atm to 11Â GPa at ambient temperature as well as ex situ on a sample quenched from 12Â GPa and ambient temperature using high-energy X-ray diffraction. The X-ray structure factors display a reduction in height of the first sharp diffraction peak and a growth of the principal diffraction peak with a concomitant shift to higher Q-values with increasing pressure. At low pressures of at least up to 5Â GPa the densification of the structure primarily involves an increase in the packing of the As4S3 molecules. At higher pressures the As4S3 molecules break up and reconnect to form a high-density network with increased extended-range ordering at the highest pressure of 11Â GPa indicating a structural transition. This high-density network structure relaxes only slightly on decompression indicating that the pressure-induced structural changes are quenchable.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Physics and Chemistry of Solids - Volume 69, Issue 9, September 2008, Pages 2336-2340
Journal: Journal of Physics and Chemistry of Solids - Volume 69, Issue 9, September 2008, Pages 2336-2340
نویسندگان
S. Soyer Uzun, S.J. Gaudio, S. Sen, Q. Mei, C.J. Benmore, C.A. Tulk, J. Xu, B.G. Aitken,