X-ray and IR analysis of Cu-Si ferrite

Polycrystalline soft ferrite, Cu1+xSixFe2−2xO4 (x=0.0x=0.0, 0.05, 0.1, 0.15, 0.2 and 0.3) were prepared by standard ceramic technique. The X-ray analysis confirmed the single phase formation of the samples up to x=0.1x=0.1 beside a second phase for x⩾0.15. The lattice parameter was found to decrease with composition(x), which is attributed to ionic size difference of cations involved. The bulk density measurements shows two different behavior for x< >0.15. The IR spectra of Cu–Si ferrite system have been analyzed in the frequency range 200–1200 cm−1. It revealed two prominent bands ν1 and ν2 which are assigned to tetrahedral and octahedral metal complexes, respectively. The position of the highest frequency band is around 575 cm−1 while the lower frequency band is around 400 cm−1.